Introducing the NEUMONDA Octopus DRAM Tester

DRAMs need to scale in speed to keep up with AI workloads. However, conducting high-speed tests of DDR5 components requires a lot of engineering effort, and keeping application tests within the defined power, temperature and voltage levels is almost impossible.

Neumonda’s Octopus DRAM tester is not only designed for tests at speeds of up to 6.4 Gbps, it can also test four different DRAM technologies (DDR4/5 and LPDDR4/5) simulating the target application. Traditional testers test one DRAM generation only.

All this in a small, light-weight board that doesn’t require any third-party IP. This is unique in the market.

Product Highlights:

• All-in-one, single board Burn-in, Array and Speed Tester, which supports max. 192 DRAM ICs or 12 DIMM modules 
• Compact footprint, lightweight, low power, and easy for manual or automated environments 
• Support commercial and industrial grade Temperature (-55C to 125C) and low voltage corner testing capabilities (e. g. (1.2V +/- 10% for DDR4)  
• Support for DDR4, LPDDR4, DDR5 and LPDDR5 DRAM generation with different DRAM package 
• Support for different Memory module standards, e.g. U-DIMM, CU-DIMM, CAMM DIMMs
• Programmable Timing Parameters like CL, CWL, tREFI, tRFC, TRCD, tRP and others 
• Special feature support like PPR (Post Package Repair) and iBECC (in Band Error Correction Code)
• Receiver margin testing under different voltage / temperature conditions 
• Customized test pattern including Linear, Bank Jump, Row Hammer, Butterfly, March, and other industries standard DRAM memory test patterns 
• Failure analysis tools help reveal Bit Failure Mapping, locating defective Device location, failure DQ, Address, etc. 
• Error result data logging system for data analysis and trackability