Introducing the NEUMONDA Rhinoe DRAM Tester

The Neumonda Rhinoe DRAM Tester is a proprietary semiconductor memory test equipment system designed to perform industry-standard DRAM burn-in test as well as complete memory cell array test at full application speed where Rhinoe will drastically reduce the efforts of DRAM testing.

With its versatile state-of-the-art Rhinoe Controller Chipset, hardware and software capabilities, Rhinoe can test a variety of memory solutions such as DDR3, DDR4, DDR5 and LPDDR4 / LPDDR4x, LPDDR5 /LPDDR5x components as well as DDR3, DDR4 and DDR5 modules. These configurations are all tested with JEDEC standard electrical AC and DC requirements using our proprietary Rhinoe Controller Chipset. The tester can sort out defective as well as weak DRAM memory devices with accurate fault coverage as effectively as any traditional tester that is commonly used in most backend factories today. Compared to traditional testers, Rhinoe consumes considerably less power, which directly translates to reduced testing costs, and it is effectively more environmentally friendly.

Product Highlights:

• All-in-one, single board Burn-in, Array and Speed Tester, which supports max. 192 DRAM ICs or 12 DIMM modules
• Compact footprint, lightweight, low power, and easy for manual or automated environments
• Support commercial and industrial grade Temperature (-40C to 95C) and low voltage (1.35+/- 10% V) corner testing capabilities
• Support DDR3 DRAM x4, x8, x16 IC components with different package sizes, along with standard JEDEC DIMM memory modules
• DDR3 testing capability of up to 1866Mbps
• Programmable Timing Parameters: (tCKE, tFAW, tMRD, tRAS, tRCD, tREFI, tRFC, tRP, tRRD, tRTP, tWR, tWTR, tXPR, tZQCS, tZQINIT, CAS latency, CAS Write latency, and burst length)
• Jitter and noise injection for stability function check
• Support error injection to None ECC DIMM configuration for functionality check, and to ensure DDR module accuracy and reliability
• Variant Voltage setting for DC / Margin Testing and Shmoo Plotting
• Variant Test Mode and customized test pattern
• Linear, Bank Jump, Row Hammer, Butterfly, March, and other industries well known DRAM memory test patterns or custom test pattern via Rhinoe GUI
• Failure analysis tools help reveal Bit Failure Mapping, locating defective Device location, failure DQ, Address, etc.
• Error result data logging system for data analysis and trackability

The Neumonda Rhinoe Tester took home the prestigous Elektra Award in the category "Test Product of the Year 2023".

Among the nine finalists, the judges considered the Rhinoe DRAM Tester as the most innovative product that ticked all the boxes.